diff --git a/anykey.kicad_pcb b/anykey.kicad_pcb index 87571fd..7370604 100644 --- a/anykey.kicad_pcb +++ b/anykey.kicad_pcb @@ -498,33 +498,33 @@ ) (module TestPoint:TestPoint_Pad_D1.5mm (layer F.Cu) (tedit 5A0F774F) (tstamp 5F92A952) - (at 101.45 71.52) + (at 154.5 84 180) (descr "SMD pad as test Point, diameter 1.5mm") (tags "test point SMD pad") (path /5FCB2854) (attr virtual) - (fp_text reference TP2 (at 0 -1.648) (layer F.SilkS) + (fp_text reference CLK (at 0 -1.7) (layer F.SilkS) (effects (font (size 1 1) (thickness 0.15))) ) (fp_text value SWCLK (at 0 1.75) (layer F.Fab) (effects (font (size 1 1) (thickness 0.15))) ) - (fp_circle (center 0 0) (end 0 0.95) (layer F.SilkS) (width 0.12)) - (fp_circle (center 0 0) (end 1.25 0) (layer F.CrtYd) (width 0.05)) (fp_text user %R (at 0 -1.65) (layer F.Fab) (effects (font (size 1 1) (thickness 0.15))) ) - (pad 1 smd circle (at 0 0) (size 1.5 1.5) (layers F.Cu F.Mask) + (fp_circle (center 0 0) (end 1.25 0) (layer F.CrtYd) (width 0.05)) + (fp_circle (center 0 0) (end 0 0.95) (layer F.SilkS) (width 0.12)) + (pad 1 smd circle (at 0 0 180) (size 1.5 1.5) (layers F.Cu F.Mask) (net 20 /SWCLK)) ) (module TestPoint:TestPoint_Pad_D1.5mm (layer F.Cu) (tedit 5A0F774F) (tstamp 5F92A94A) - (at 97.9 71.52) + (at 152.5 79.5 180) (descr "SMD pad as test Point, diameter 1.5mm") (tags "test point SMD pad") (path /5FCAA338) (attr virtual) - (fp_text reference TP1 (at 0 -1.648) (layer F.SilkS) + (fp_text reference DIO (at 0 -1.7) (layer F.SilkS) (effects (font (size 1 1) (thickness 0.15))) ) (fp_text value SWDIO (at 0 1.75) (layer F.Fab) @@ -535,7 +535,7 @@ (fp_text user %R (at 0 -1.65) (layer F.Fab) (effects (font (size 1 1) (thickness 0.15))) ) - (pad 1 smd circle (at 0 0) (size 1.5 1.5) (layers F.Cu F.Mask) + (pad 1 smd circle (at 0 0 180) (size 1.5 1.5) (layers F.Cu F.Mask) (net 19 /SWDIO)) )